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USPTO to Host First-Ever Summit on Patent Quality

03-Mar-2015 | Source : USPTO | Visits : 8235
WASHINGTON – The US Department of Commerce’s Patent and Trademark Office (USPTO) will host a two-day public meeting on patent quality on March 25 and March 26, 2015 at the USPTO headquarters in Alexandria, Virginia.  According to the USPTO, the Quality Summit will encourage robust discussions among USPTO leadership; patent prosecutors, litigators, applicants and licensees; and other members of the public interested in USPTO’s efforts to further improve patent quality through its Enhanced Patent Quality Initiative.
USPTO is seeking public input and guidance to direct its continued efforts towards enhancing patent quality.  These efforts focus on improving patent operations and procedures to provide the best possible work products, to enhance the customer experience, and to improve existing quality metrics. USPTO has already set in motion several quality initiatives, including robust technical and legal training for patent examiners, as well as a Glossary Pilot, Quick Patent IDS Program, First Action Interview Pilot, and After Final Consideration Pilot. The two-day Quality Summit is one of many ways the USPTO is engaging with the public on this important effort.
“High quality patents permit certainty and clarity of rights, which in turn fuels innovation and reduces needless litigation,” said Deputy Under Secretary of Commerce for Intellectual Property and Deputy Director of the USPTO Michelle K. Lee. “Our Enhanced Patent Quality Initiative will allow us to further improve patent quality through direct and ongoing engagement.”
The Quality Summit will be broadcast via webinar and recorded for later viewing. The USPTO is also seeking public comment separate from the Quality Summit on its Enhanced Patent Quality Initiative; comments in this round will be accepted through May 6, 2015. For further information about the summit and instructions for submitting comments, please refer to the Federal Register Notice(link is external). You can also read Deputy Under Secretary Lee’s Director’s Forum blog post on the Enhanced Patent Quality Initiative.

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